JESD-22-C101 › Field-Induced Charged-Device Model Test Method for Electrostatic- Discharge-Withstand Thresholds of Microelectronic Components

JESD-22-C101 - REVISION F - CURRENT
Show Complete Document History


Field-Induced Charged-Device Model Test Method for Electrostatic- Discharge-Withstand Thresholds of Microelectronic Components


This document comes with our free Notification Service, good for the life of the document.

This document is available in either Paper or PDF format.

 

Customers who bought this document also bought:

MIL-STD-883
Microcircuits

MIL-STD-202
Test Method Standard for Electronic and Electrical Component Parts

ISO-9001
Quality management systems - Requirements

ORDER

Price:

$59.00        


Want this as a site license?



Document Number

JESD-22-C101

Revision Level

REVISION F

Status

Current

Publication Date

Oct. 1, 2013

Page Count

18 pages