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Scope

Part 3 of this test method standard establishes uniform test methods for the electrical testing of semiconductor transistors to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This part of a multipart test method standard is intended to apply only to semiconductor devices.

Notes

Claudia's Notes:
The electrical test methods included in this part are numbered 3000 to 3999 inclusive.  Revisions are numbered consecutively using a period to separate the test method number and the revision number.  For example, 3011.2 designates the second revision of test method 3011.

To find similar documents by Federal Supply Class Code:

FSC 5961 (Semiconductor Devices and Associated Hardware)

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