ASTM-E2382 › Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
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Scope
1.1 All microscopes are subject to artifacts. The purpose of this document is to provide a description of commonly observed artifacts in scanning tunneling microscopy (STM) and atomic force microscopy (AFM) relating to probe motion and geometric considerations of the tip and surface interaction, provide literature references of examples and, where possible, to offer an interpretation as to the source of the artifact. Because the scanned probe microscopy field is a burgeoning one, this document is not meant to be comprehensive but rather to serve as a guide to practicing microscopists as to possible pitfalls one may expect. The ability to recognize artifacts should assist in reliable evaluation of instrument operation and in reporting of data.
1.2 A limited set of terms will be defined here. A full description of terminology relating to the description, operation, and calibration of STM and AFM instruments is beyond the scope of this document.
Keywords
Abbe offset error; creep; dilation; hysteresis; nonlinearity; probe-sample mixing; AFM; STM; tip shape; proximal probe; geometric mixing; image reconstruction; ICS Number Code 17.040.20 (Properties of surfaces)
To find similar documents by ASTM Volume:
03.06 (Molecular Spectroscopy; Surface Analysis)
To find similar documents by classification:
17.040.20 (Properties of surfaces)
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Document Number
ASTM-E2382-04R20
Revision Level
2004 R20 EDITION
Status
Current
Modification Type
New
Publication Date
Dec. 4, 2020
Document Type
Guide
Page Count
22 pages
Committee Number
E42.14