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Scope

1.1 These test methods cover procedures for testing devices that are sealed prior to testing, such as semiconductors, hermetically enclosed relays, pyrotechnic devices, etc., for leakage through the walls of the enclosure. They may be used with various degrees of sensitivity (depending on the internal volume, the strength of the enclosure, the time available for preparation of test, and on the sorption characteristics of the enclosure material for helium). In general practice the sensitivity limits are from 4.4 X 10 -15 to 4.4 X 10 -11 moles/s (10 -9 standard cm /s to 10 -5 standard cm /s at 0°C) for helium, although these limits may be exceeded by several decades in either direction in some circumstances.

1.2 Two test methods are described:

1.2.1 Test Method A -Test part preparation by bombing.

1.2.2 Test Method B -Test part preparation by prefilling.

1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Keywords

bell jar leak test; bomb mass spectrometer leak test; helium leak test; helium leak testing; leak testing; mass spectrometer leak testing; sealed object mass spectrometer leak test; ICS Number Code 19.100 (Non-destructive testing)

To find similar documents by ASTM Volume:

03.03 (Nondestructive Testing)

To find similar documents by classification:

19.100 (Non-destructive testing Including testing equipment: industrial apparatus for X-ray and gamma radiography, penetrant flaw detectors, etc. Non-destructive testing of welded joints, see 25.160.40 Industrial radiographic films, see 37.040.25 Non-destructive testing of metals, see 77.040.20)

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