ASTM-E673 › Standard Terminology Relating to Surface Analysis (Withdrawn 2012)
The following bibliographic material is provided to assist you with your purchasing decision:
Scope
1.1 This terminology is related to the various disciplines involved in surface analysis.
1.2 The definitions listed apply to (a) Auger electron spectroscopy (AES), (b) X-ray photoelectron spectroscopy (XPS), (c) ion-scattering spectroscopy (ISS), (d) secondary ion mass spectrometry (SIMS), and (e) energetic ion analysis (EIA).
Keywords
terminology; surface analysis; ICS Number Code 01.040.17 (Metrology and measurement. Physical phenomena (Vocabularies)); 17.040.20 (Properties of surfaces)
To find similar documents by ASTM Volume:
03.06 (Molecular Spectroscopy; Surface Analysis)
To find similar documents by classification:
01.040.17 (Metrology and measurement. Physical phenomena (Vocabularies))
17.040.20 (Properties of surfaces)
This document comes with our free Notification Service, good for the life of the document.
This document is available in either Paper or PDF format.
Document Number
ASTM-E673-03
Revision Level
2003 EDITION
Status
Superseded
Modification Type
Withdrawn
Publication Date
Dec. 1, 2003
Document Type
Terminology
Page Count
10 pages
Committee Number
E42.02