ASTM-E986 › Complete Document History
Standard Practice for Scanning Electron Microscope Beam Size Characterization

Complete Current Edition:
   2004 R17 EDITION - REAPPROVED IN 2017 - June 15, 2017

Obsolete Revision Information:
   2004 R10 EDITION - REAPPROVED IN 2010 - May 1, 2010
   2004 EDITION - SCANNING ELECTRON MICROSCOPE B - July 1, 2004
   1997 EDITION - SCANNING ELECTRON MICROSCOPE P - Oct. 10, 1997
   1992 EDITION - SCANNING ELECTRON MICROSCOPE P - July 15, 1992
   1986 EDITION - SCANNING ELECTRON MICROSCOPE P - Feb. 28, 1986