ASTM-F1189 › Test Method for Using Computer-Assisted Infrared Spectrophotometry to Measure the Interstitial Oxygen Content of Silicon Slices Polished on Both Sides (Withdrawn 1993)

ASTM-F1189 - 1988 EDITION - SUPERSEDED
Show Complete Document History

Document Center Inc. is an authorized dealer of ASTM standards.
The following bibliographic material is provided to assist you with your purchasing decision:

Test Method for Using Computer-Assisted Infrared Spectrophotometry to Measure the Interstitial Oxygen Content of Silicon Slices Polished on Both Sides (Withdrawn 1993)
ORDER

Want this as a site license?

Keywords

ICS Number Code 29.045 (Semiconducting materials)

To find similar documents by classification:

29.045 (Semiconducting materials)

This document comes with our free Notification Service, good for the life of the document.

This document is available in Paper format.

 

Customers who bought this document also bought:

MIL-STD-883
Microcircuits

AIAG SEMICON SUPP
Qs 9000 Semiconductor Supplement

MIL-PRF-38535
Integrated Circuits (Microcircuits) Manufacturing, General Specification for

Document Number

ASTM-F1189-88

Revision Level

1988 EDITION

Status

Superseded

Modification Type

Withdrawn

Publication Date

Oct. 31, 1988

Document Type

Test Method

Page Count

4 pages