ASTM-F1227 › Test Method for Total Mass Loss of Materials and Condensation of Outgassed Volatiles on Microelectronics-Related Substrates (Withdrawn 2000)
Test Method for Total Mass Loss of Materials and Condensation of Outgassed Volatiles on Microelectronics-Related Substrates (Withdrawn 2000)
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Document Number
ASTM-F1227-89(1994)e1
Revision Level
1989 R94(E1) EDITION
Status
Superseded
Publication Date
Sept. 1, 1994
Page Count
7 pages