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ASTM-F419
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Complete Document History
Test Method for Determining Carrier Density in Silicon Epitaxial Layers by Capacitance-Voltage Measurements on Fabricated Junction or Schottky Diodes (Withdrawn 2001)
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Obsolete Revision Information:
1994 EDITION - Determining Carrier Density in Silicon Epitaxial Layers by C - Aug. 15, 1994
1988 EDITION - Determining Carrier Density in Silicon Epitaxial Layers by C - May 27, 1988