BS-EN-IEC-60749-18 › Semiconductor devices. Mechanical and climatic test methods

BS-EN-IEC-60749-18 - 2019 EDITION - CURRENT


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Semiconductor devices. Mechanical and climatic test methods

Keywords

Mechanical testing;Electronic equipment and components;Gamma-radiation;Space technology;Cobalt;Military engineering;Semiconductor devices;Environmental testing;Annealing;Integrated circuits;Ionizing radiation;Climate

To find similar documents by classification:

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29.020 (Electrical engineering in general Including voltages, general electrical terminology, electrical documentation, electrical tables, safety, fire hazard testing, etc. Electrical diagrams and charts, see 01.100.25 Electrical power stations, see 27.100 Electromagnetic compatibility, see 33.100)

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Document Number

BS EN IEC 60749-18:2019

Revision Level

2019 EDITION

Status

Current

Publication Date

June 10, 2019

Replaces

BS EN 60749-18:2003

Page Count

26

ISBN

9780539002348

International Equivalent

EN 60749-18 Ed.2.0;IEC 60749-18 Ed.2.0

Committee Number

EPL/47