BS-EN-IEC-60749-28-TC › Tracked Changes. Semiconductor devices. Mechanical and climatic test methods
BS-EN-IEC-60749-28-TC
-
2022 EDITION
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CURRENT
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Tracked Changes. Semiconductor devices. Mechanical and climatic test methods
Keywords
Electric discharges;Electric charge;Environmental testing;Electronic equipment and components;Mechanical testing;Semiconductor devices;Integrated circuits;Electrostatics;Test methods
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
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Document Number
BS EN IEC 60749-28:2022 - TC
Revision Level
2022 EDITION
Status
Current
Publication Date
Dec. 22, 2022
Page Count
124
ISBN
9780539238570
Committee Number
EPL/47