BS-IEC-60747-3 › Semiconductor devices

BS-IEC-60747-3 - 2013 EDITION - CURRENT


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Semiconductor devices

Keywords

Ratings;Performance testing;Diodes;Current measurement;Electronic equipment and components;Semiconductor devices;Switches;Semiconductor diodes;Power measurement (electric);Test equipment;Symbols;Resistance measurement;Power losses;Noise (spurious signals);Definitions;Endurance testing;Voltage measurement;Electrical properties and phenomena;Capacitance measurement;Electrical measurement;Testing conditions;Failure (quality control);Circuits;Charge measurement;Letters (symbols);Electrical testing;Electrical conductance;Voltage-reference diodes;Signal diodes;Efficiency

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31.080.10 (Diodes)

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Document Number

BS IEC 60747-3:2013

Revision Level

2013 EDITION

Status

Current

Publication Date

April 30, 2015

Replaces

BS 6493-1.3:1986

Page Count

38

ISBN

9780580722028

International Equivalent

IEC 60747-3:2013

Committee Number

EPL/47