BS-IEC-63003 › Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505TM
BS-IEC-63003
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2015 EDITION
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CURRENT
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Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505TM
Keywords
Records (documents);Data processing;Life cycle;Software engineering techniques;Data management;Documents;Information;Process control;Data;Life (durability);Computer software
To find similar documents by classification:
25.040.01 (Industrial automation systems in general)
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Document Number
BS IEC 63003:2015
Revision Level
2015 EDITION
Status
Current
Publication Date
Jan. 31, 2016
Page Count
174
ISBN
9780580911064
International Equivalent
IEC 63003:2015
Committee Number
EPL/501