BS-ISO-14606-TC › Tracked Changes. Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
BS-ISO-14606-TC
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2022 EDITION
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CURRENT
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Tracked Changes. Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
Keywords
X-ray photoelectron spectroscopy;Chemical analysis and testing;Photoelectron spectroscopy;Spectroscopy;X-rays;Depth
To find similar documents by classification:
71.040.40 (Chemical analysis Including analysis of gases and surface chemical analysis)
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Document Number
BS ISO 14606:2022 - TC
Revision Level
2022 EDITION
Status
Current
Publication Date
Feb. 17, 2023
Page Count
60
ISBN
9780539260014
Committee Number
CII/60