BS-ISO-23830 › Surface chemical analysis. Secondary-ion mass spectrometry. Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
BS-ISO-23830
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2008 EDITION
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CURRENT
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Surface chemical analysis. Secondary-ion mass spectrometry. Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
Keywords
Surface chemistry;Ions;Reproducibility;Chemical analysis and testing;Secondary;Mass spectrometers;Mass spectrometry;Measurement characteristics
To find similar documents by classification:
71.040.40 (Chemical analysis Including analysis of gases and surface chemical analysis)
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Document Number
BS ISO 23830:2008
Revision Level
2008 EDITION
Status
Current
Publication Date
Dec. 31, 2008
Page Count
24
ISBN
9780580557668
International Equivalent
ISO 23830:2008
Committee Number
CII/60