DD-IEC/PAS-62483 › Test method for measuring whisker growth on tin and tin alloy surface finishes
DD-IEC/PAS-62483
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2006 EDITION
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SUPERSEDED
-- See the following:
BS-IEC-62483
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Test method for measuring whisker growth on tin and tin alloy surface finishes
Keywords
Tin;Tin alloys;Electronic equipment and components;Electroplating;Solders;Testing conditions;Corrosion;Metal coatings;Environmental testing;Surfaces;Finishes;Surface defects;Electrical components
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
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Document Number
DD IEC/PAS 62483:2006
Revision Level
2006 EDITION
Status
Superseded
Publication Date
Feb. 28, 2007
Replaced By
BS IEC 62483:2013
Page Count
30
ISBN
9780580501470
International Equivalent
IEC/PAS 62483:2006
Committee Number
EPL/47