IEC-60068-2-82 › Historical Revision Information
Part 2-82: Tests - Test Tx: Whisker Test Methods for Electronic & Electric Components,
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IEC 60068-2-82:2007 specifies whisker tests for electric or electronic components representing the finished stage, with tin or tin-alloy finish. However, the standard does not specify tests for whiskers that may grow as a result of external mechanical stress. This test method is employed by a relevant specification (international component or application specification) with transfer of the test severities to be applied and with defined acceptance criteria. Where tests described in this standard are considered for other components, e.g. mechanical parts as used in electrical or electronic equipment, it should be ensured that the material system and whisker growth mechanisms are comparable.
To find similar documents by classification:
19.040 (Environmental testing Including testing equipment)
31.190 (Electronic component assemblies Including preassembled modules)
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Document Number
IEC 60068-2-82 Ed. 1.0 b:2007
Revision Level
1ST EDITION
Status
Superseded
Publication Date
May 1, 2007
Committee Number
91