IEC-60747-18-1 › Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors

IEC-60747-18-1 - EDITION 1.0 - CURRENT


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IEC 60747-18-1:2019 (E) specifies the test methods and data analysis for the calibration of lens-free CMOS photonic array sensors. This document includes the test conditions of each process, configuration of lens-free CMOS photonic array sensors, statistical analysis of test data, calibration for planarization and linearity, and test reports.
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Document Number

IEC 60747-18-1 Ed. 1.0 en:2019

Revision Level

EDITION 1.0

Status

Current

Publication Date

May 1, 2019

Committee Number

47E