IEC-60749-31 › Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
IEC-60749-31
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EDITION 1.0
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CURRENT
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EDITION 1.0 - Aug. 1, 2002
1ST EDITION CORRIGENDUM 1 - Aug. 1, 2003
1ST EDITION CORRIGENDUM 1 - Aug. 1, 2003
Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads.
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
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Document Number
IEC 60749-31 Ed. 1.0 b:2002
Revision Level
EDITION 1.0
Status
Current
Publication Date
Aug. 1, 2002
Committee Number
47