IEC-61445 › Digital Test Interchange Format (DTIF)

IEC-61445 - EDITION 1.0 - CURRENT


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IEC 61445:2012(E) defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following:
a) UUT Model;
b) Stimulus and Response;
c) Fault Dictionary;
d) Probe.
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Document Number

IEC 61445 Ed. 1.0 en:2012

Revision Level

EDITION 1.0

Status

Current

Publication Date

June 21, 2012

Committee Number

91