IEC-61945 › Interated circuits - Manufacturing line approval - Methodology for technology and failure analysis

IEC-61945 - 1ST EDITION - CURRENT


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Gives the methodology for technology and failure analysis in manufacturing integrated circuits. Technology analysis is used to determine the way a component is built by observing it using adequate resolution, which increases progressively with the level of analysis.
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31.200 (Integrated circuits. Microelectronics Including electronic chips, logical and analogue microstructures Microprocessors, see 35.160)

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Document Number

IEC/TS 61945 Ed. 1.0 b:2000

Revision Level

1ST EDITION

Status

Current

Publication Date

March 1, 2000

Committee Number

47A