IEC-62132-2 Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method

IEC-62132-2 - EDITION 1.0 - CURRENT


Document Center Inc. is an authorized dealer of IEC standards.
The following bibliographic material is provided to assist you with your purchasing decision:


IEC 62132-2:2010 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances. The frequency range of this method is from 150 kHz to 1 GHz, or as limited by the characteristics of the TEM cell.
ORDER

Price:

$187.21        


Want this as a site license?

To find similar documents by classification:

31.200 (Integrated circuits. Microelectronics Including electronic chips, logical and analogue microstructures Microprocessors, see 35.160)

This document comes with our free Notification Service, good for the life of the document.

This document is available in either Paper or PDF format.

 

Customers who bought this document also bought:

JESD-47
Stress-Test-Driven Qualification of Integrated Circuits

IEC-61000-4-2
Electromagnetic compatibility (EMC) - Part 4-2: Testing and measurement techniques - Electrostatic discharge immunity test

ISO-9001
Quality management systems - Requirements

Document Number

IEC 62132-2 Ed. 1.0 b:2010

Revision Level

EDITION 1.0

Status

Current

Publication Date

March 1, 2010

Committee Number

47A