IEC-62526 › Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

IEC-62526 - EDITION 1.0 - CURRENT


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Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE environments;(b) specifies patten, format, and timing information sufficant to define the application of digital test vectors to a DUT;and (c) supports the volume of test vector data generated from structured tests.
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Document Number

IEC 62526 Ed. 1.0 en:2007

Revision Level

EDITION 1.0

Status

Current

Publication Date

Nov. 1, 2007

Committee Number

91