IEC-62607-6-16 › Nanomanufacturing - Key control characteristics - Part 6-16: Two-dimensional materials - Carrier concentration: Field effect transistor method
IEC-62607-6-16
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EDITION 1.0
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CURRENT
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IEC TS 62607:2022 establishes a standardized method to determine the key control characteristic
- carrier concentration
- field effect transistor (FET) method.
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Document Number
IEC/TS 62607-6-16 Ed. 1.0 en:2022
Revision Level
EDITION 1.0
Status
Current
Publication Date
Nov. 1, 2022
Committee Number
113