IEC-62916 › Photovoltaic modules - Bypass diode electrostatic discharge susceptibility testing
IEC-62916
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EDITION 1.0
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CURRENT
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IEC TS 62916:2017(E) describes a discrete component bypass diode electrostatic discharge (ESD) immunity test and data analysis method. The test method described subjects a bypass diode to a progressive ESD stress test and the analysis method provides a means for analyzing and extrapolating the resulting failures using the two-parameter Weibull distribution function. It is the object of this document to establish a common and reproducible test method for determining diode surge voltage tolerance consistent with an ESD event during the manufacturing, packaging, transportation or installation processes of PV modules.
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Document Number
IEC/TS 62916 Ed. 1.0 en:2017
Revision Level
EDITION 1.0
Status
Current
Publication Date
April 1, 2017
Committee Number
82