IEC-63342 › C-Si photovoltaic (PV) modules - Light and elevated temperature induced degradation (LETID) test - Detection
IEC-63342
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EDITION 1.0
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CURRENT
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IEC TS 63342:2022 is designed to assess the effect of light induced degradation at elevated temperatures (LETID) by application of electrical current at higher temperatures. In this document, only the current injection approach for the detection of LETID is addressed.
This document does not address the B-O and Iron Boron (Fe-B) related degradation phenomena, which already occur at room temperatures under the presence of light and on much faster time scales. The proposed test procedure can reveal sample sensitivity to LETID degradation mechanisms, but it does not provide an exact measure of field observable degradation.
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Document Number
IEC/TS 63342 Ed. 1.0 en:2022
Revision Level
EDITION 1.0
Status
Current
Publication Date
July 1, 2022
Committee Number
82