ISO-22278 › Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam

ISO-22278 - 1ST EDITION - CURRENT


Document Center Inc. is an authorized dealer of ISO standards.
The following bibliographic material is provided to assist you with your purchasing decision:


This document specifies the test method for measuring the crystalline quality of single-crystal thin film (wafer) using the XRD method with parallel X-ray beam. This document is applicable to all of the single-crystal thin film (wafer) as bulk or epitaxial layer structure.

ORDER

Price:

$188.18        


Want this as a site license?

To find similar documents by classification:

81.060.30 (Advanced ceramics)

This document comes with our free Notification Service, good for the life of the document.

This document is available in either Paper or PDF format.

Document Number

ISO 22278:2020

Revision Level

1ST EDITION

Status

Current

Publication Date

Aug. 1, 2020

Committee Number

ISO/TC 206