ISO-22933 › Surface chemical analysis - Secondary ion mass spectrometry - Method for the measurement of mass resolution in SIMS

ISO-22933 - 1ST EDITION - CURRENT


Document Center Inc. is an authorized dealer of ISO standards.
The following bibliographic material is provided to assist you with your purchasing decision:


This document specifies a method for measuring the mass resolution in SIMS, and how to compare the mass resolution between different instruments (e.g. TOF-SIMS, Magnetic SIMS, Quadrupole SIMS, Fourier Transform SIMS, etc.) by considering the peak shapes.

ORDER

Price:

$120.28        


Want this as a site license?

To find similar documents by classification:

71.040.40 (Chemical analysis Including analysis of gases and surface chemical analysis)

This document comes with our free Notification Service, good for the life of the document.

This document is available in either Paper or PDF format.

Document Number

ISO/TS 22933:2022

Revision Level

1ST EDITION

Status

Current

Publication Date

April 1, 2022

Committee Number

ISO/TC 201/SC 6