ISO-23729 › Surface chemical analysis - Atomic force microscopy - Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
ISO-23729
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1ST EDITION
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CURRENT
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This document describes a procedure for the quantitative characterization of the probe tip of an atomic force microscope (AFM) probe and a restoration of AFM topography images dilated by finite probe size. The three-dimensional shape of the probe apex is extracted by image reconstruction using suitable reference materials. This document is applicable to the reconstruction of AFM topography images of solid material surfaces.
To find similar documents by classification:
71.040.40 (Chemical analysis Including analysis of gases and surface chemical analysis)
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Document Number
ISO 23729:2022
Revision Level
1ST EDITION
Status
Current
Publication Date
July 1, 2022
Committee Number
ISO/TC 201/SC 9