ISO-23729 Surface chemical analysis - Atomic force microscopy - Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size

ISO-23729 - 1ST EDITION - CURRENT


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This document describes a procedure for the quantitative characterization of the probe tip of an atomic force microscope (AFM) probe and a restoration of AFM topography images dilated by finite probe size. The three-dimensional shape of the probe apex is extracted by image reconstruction using suitable reference materials. This document is applicable to the reconstruction of AFM topography images of solid material surfaces.

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Document Number

ISO 23729:2022

Revision Level

1ST EDITION

Status

Current

Publication Date

July 1, 2022

Committee Number

ISO/TC 201/SC 9