ISO-23833 › Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary

ISO-23833 - 2ND EDITION - CURRENT
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ISO 23833:2013 defines terms used in the practices of electron probe microanalysis (EPMA). It covers both general and specific concepts classified according to their hierarchy in a systematic order.

ISO 23833:2013 is applicable to all standardization documents relevant to the practices of EPMA. In addition, some parts of ISO 23833:2013 are applicable to those documents relevant to the practices of related fields (SEM, AEM, EDX, etc.) for definition of those terms common to them.

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Document Number

ISO 23833:2013

Revision Level

2ND EDITION

Status

Current

Publication Date

April 15, 2013

Committee Number

ISO/TC 202/SC 1