MIL-STD-750/5 › Historical Revision Information
High Reliability Space Application Test Methods for Semiconductor Devices Part 5: Test Methods 5000 through 5999
High Reliability Space Application Test Methods for Semiconductor Devices Part 5: Test Methods 5000 through 5999
Scope
Part 5 of this test method standard establishes uniform test methods for the basic high reliability space application testing of semiconductor devices to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This part of a multipart test method standard is intended to apply only to semiconductor devices.
Notes
Claudia's Notes:
The intended use of this test method standard is to establish appropriate conditions for testing semiconductor devices to give test results that simulate the actual service conditions existing in the field. This test method standard has been prepared to provide uniform test methods, controls, and procedures for determining with predictability the suitability of such devices within military, aerospace and special application equipment.
To find similar documents by Federal Supply Class Code:
FSC 5961 (Semiconductor Devices and Associated Hardware)
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Document Number
MIL-STD-750-5
Revision Level
BASE
Status
Superseded
Publication Date
Jan. 3, 2012
Page Count
19 pages