PD-IEC-63258 › Nanotechnologies. A guideline for ellipsometry application to evaluate the thickness of nanoscale films

PD-IEC-63258 - 2021 EDITION - CURRENT


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Nanotechnologies. A guideline for ellipsometry application to evaluate the thickness of nanoscale films

Keywords

Nanoparticles;Particulate materials;Materials by form;Nanomaterials;Nanotechnology

To find similar documents by classification:

07.120 (Nanotechnologies)

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Document Number

PD IEC TR 63258:2021

Revision Level

2021 EDITION

Status

Current

Publication Date

March 26, 2021

Page Count

24

ISBN

9780539009309

International Equivalent

ISO/TR 23397

Committee Number

NTI/1