PD-ISO-19319 › Surface chemical analysis. Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
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Surface chemical analysis. Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
Keywords
Auger electron spectroscopy;Surface chemistry;Electron emission;Photoelectron spectroscopy;Chemical analysis and testing;Spectroscopy;Resolution;Area;Surfaces;Chemical composition;X-ray photoelectron spectroscopy
To find similar documents by classification:
71.040.40 (Chemical analysis Including analysis of gases and surface chemical analysis)
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Document Number
PD ISO/TR 19319:2013
Revision Level
2013 EDITION
Status
Current
Publication Date
March 31, 2013
Replaces
PD ISO/TR 19319:2003
Page Count
126
ISBN
9780580711862
International Equivalent
ISO/TR 19319:2013
Committee Number
CII/60