PD-ISO-22335 › Surface chemical analysis. Depth profiling. Measurement of sputtering rate. Mesh-replica method using a mechanical stylus profilometer
PD-ISO-22335
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2007 EDITION
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CURRENT
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Surface chemical analysis. Depth profiling. Measurement of sputtering rate. Mesh-replica method using a mechanical stylus profilometer
Keywords
Chemical analysis and testing;X-ray fluorescence spectrometry;Profilometers;Depth;Surface chemistry;Profile measurement;Surface properties;Spectroscopy;Spectrochemical analysis;Electron beams;X-ray analysis
To find similar documents by classification:
71.040.40 (Chemical analysis Including analysis of gases and surface chemical analysis)
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Document Number
PD ISO/TR 22335:2007
Revision Level
2007 EDITION
Status
Current
Publication Date
Aug. 31, 2007
Page Count
28
ISBN
9780580540141
International Equivalent
ISO/TR 22335:2007
Committee Number
CII/60