SS-EN-12698-2 › Chemical analysis of nitride bonded silicon carbide refractories - Part 2: XRD methods
SS-EN-12698-2
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2007 EDITION
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CURRENT
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This standard describes methods for the determination of mineralogical phases typically apparent in nitride and oxy-nitride bonded silicon carbide refractory products using a Bragg-Brentano diffractometer. It includes details of sample preparation and general principles for qualitative and quantitative analysis of mineralogical phase composition. Quantitative determination of a-Si3N4, ß-Si3N4, Si2ON2, AlN, and SiAlON are described.
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Designation Name
SS-EN 12698-2:2007
Revision Level
2007 EDITION
Status
Current
Publication Date
April 18, 2007
Language(s)
English
Page Count
14
International Equivalent
EN 12698-2:2007(IDT)