SS-ISO-11505 › Surface chemical analysis - General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry (ISO 11505:2012, IDT)
SS-ISO-11505
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2013 EDITION
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CURRENT
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ISO 11505:2013 describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films. It is limited to a description of general procedures of quantification of GD-OES and is not applicable directly for the quantification of individual materials having various thicknesses and elements to be determined.
To find similar documents by classification:
71.040.40 (Chemical analysis Including analysis of gases and surface chemical analysis)
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Designation Name
SS-ISO 11505:2013
Revision Level
2013 EDITION
Status
Current
Publication Date
April 2, 2013
Language(s)
English
Page Count
44
International Equivalent
ISO 11505:2012(IDT)