ASTM-D6095 Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials

ASTM-D6095 - 2012 R18 EDITION - CURRENT
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Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
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Scope

1.1 This test method covers the procedure for determining the volume resistivity, measured longitudinally, of extruded crosslinked and thermoplastic semiconducting, conductor and insulation shields for wire and cable.

1.2 In common practice the conductor shield is often referred to as the strand shield.

1.3 Technically, this test method is the measurement of a resistance between two electrodes on a single surface and modifying that value using dimensions of the specimen geometry to calculate a resistivity. However, the geometry of the specimen is such as to support the assumption of a current path primarily throughout the volume of the material between the electrodes, thus justifying the use of the term “longitudinal volume resistivity.” (See 3.1.2.1.)

1.4 Whenever two sets of values are presented, in different units, the values in the first set are the standard, while those in parentheses are for information only.

1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. For a specific hazard statement, see 7.1.

1.6 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

Significance and Use

4.1 The electrical behavior of semiconducting extruded shielding materials is important for a variety of reasons, such as safety, static charges, and current transmission. This test method is useful in predicting the behavior of such semiconducting compounds. Also see Test Method D4496.

Keywords

conductor shield; conductor shielding material; insulation shield; insulation shielding material; moderately conductive; semiconducting shielding materials; semiconducting shields; volume resistivity of shielding materials;; ICS Number Code 29.045 (Semiconducting materials); 29.060.01 (Electrical wires and cables in general)

To find similar documents by ASTM Volume:

10.02 (Electrical Insulation (II): D2518 - latest)

To find similar documents by classification:

29.045 (Semiconducting materials)

29.060.01 (Electrical wires and cables in general)

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Document Number

ASTM-D6095-12(2018)

Revision Level

2012 R18 EDITION

Status

Current

Modification Type

Reapproval

Publication Date

Nov. 1, 2018

Document Type

Test Method

Page Count

4 pages

Committee Number

D09.07