ASTM-E1078 Standard Guide for Specimen Preparation and Mounting in Surface Analysis

ASTM-E1078 - 2014 R20 EDITION - CURRENT
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Standard Guide for Specimen Preparation and Mounting in Surface Analysis
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Scope

1.1 This guide covers specimen preparation and mounting prior to, during, and following surface analysis.

1.2 This guide applies to the following surface analysis disciplines:

1.2.1 Auger electron spectroscopy (AES),

1.2.2 X-ray photoelectron spectroscopy (XPS or ESCA), and

1.2.3 Secondary ion mass spectrometry, SIMS.

1.2.4 Although primarily written for AES, XPS, and SIMS, methods will also apply to many surface sensitive analysis methods such as ion scattering spectrometry, low energy electron diffraction, and electron energy loss spectroscopy, where specimen handling can influence surface sensitive measurements.

1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Keywords

auger electron spectroscopy; secondary ion mass spectroscopy; surface analysis; x-ray photoelectron spectroscopy

To find similar documents by ASTM Volume:

03.06 (Molecular Spectroscopy; Surface Analysis)

To find similar documents by classification:

71.040.50 (Physicochemical methods of analysis Including spectrophotometric and chromatographic analysis)

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Document Number

ASTM-E1078-14R20

Revision Level

2014 R20 EDITION

Status

Current

Modification Type

Revision

Publication Date

Dec. 4, 2020

Document Type

Guide

Page Count

11 pages

Committee Number

E42.03