ASTM-E1172 Standard Practice for Describing and Specifying a Wavelength Dispersive X-Ray Spectrometer

ASTM-E1172 - 2022 EDITION - CURRENT
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Standard Practice for Describing and Specifying a Wavelength Dispersive X-Ray Spectrometer
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Scope

1.1 This practice covers the components of a wavelength dispersive X-ray spectrometer that are basic to its operation and to the quality of its performance. It is not the intent of this practice to specify component tolerances or performance criteria, as these are unique for each instrument. However, the practice does attempt to identify which tolerances are critical and thus which should be specified.

1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. Specific safety hazard statements are given in Section 7.

1.3 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

Significance and Use

4.1 This practice describes the essential components of a wavelength dispersive X-ray spectrometer. This description is presented so that the user may gain a general understanding of the structure of an X-ray spectrometer system. It also provides a means for comparing and evaluating different systems as well as understanding the capabilities and limitations of each instrument.

4.2 A laboratory may implement this practice or an X-ray fluorescence method in partnership with a manufacturer of the analytical instrumentation. If a laboratory chooses to consult with an instrument manufacturer, then the following should be considered. The laboratory should know the alloy matrices to be analyzed, elements and mass fraction ranges to be determined, and the expected performance requirements for each of these elements. The laboratory should inform the instrument manufacturer of these requirements so an analytical method may be developed which meets the laboratory’s expectations. Typically, instrument manufacturers customize the instrument configuration to satisfy the end-user’s requirements for elemental coverage, elemental precision, and detection limits. Instrument manufacturer developed analytical methods may include specific parameters for sample excitation, wavelengths, inter-element interference corrections, calibration and regression, equipment configuration/installation, and sample preparation requirements. Laboratories should have a basic understanding of the parameters derived by the manufacturer.

Keywords

sequential spectrometer; simultaneous spectrometer; spectrometry; X-ray fluorescence; X-ray spectrometer ;

To find similar documents by ASTM Volume:

03.05 (Analytical Chemistry for Metals, Ores, and Related Materials: E 32 - latest)

To find similar documents by classification:

17.180.30 (Optical measuring instruments Including spectroscopes, geodetic instruments, etc. Ophthalmic optics and instruments, see 11.040.70 Laser equipment, see 31.260 Fibre optics, see 33.180 Optical equipment, materials and components, see 37.020 Photographic equipment lenses, see 37.040.10)

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Document Number

ASTM-E1172-22

Revision Level

2022 EDITION

Status

Current

Modification Type

Revision

Publication Date

Jan. 5, 2023

Document Type

Practice

Page Count

5 pages

Committee Number

E01.20