ASTM-E1854 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts

Show Complete Document History

Document Center Inc. is an authorized dealer of ASTM standards.
The following bibliographic material is provided to assist you with your purchasing decision:

Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts



Changes from the previous issue

A redline edition is available for this document, with all changes visible. Ask Document Center Inc. for more information.


1.1 This practice sets forth requirements to ensure consistency in neutron-induced displacement damage testing of silicon and gallium arsenide electronic piece parts. This requires controls on facility, dosimetry, tester, and communications processes that affect the accuracy and reproducibility of these tests. It provides background information on the technical basis for the requirements and additional recommendations on neutron testing.

1.2 Methods are presented for ensuring and validating consistency in neutron displacement damage testing of electronic parts such as integrated circuits, transistors, and diodes. The issues identified and the controls set forth in this practice address the characterization and suitability of the radiation environments. They generally apply to reactor sources, accelerator-based neutron sources, such as 14-MeV DT sources, and 252Cf sources. Facility and environment characteristics that introduce complications or problems are identified, and recommendations are offered to recognize, minimize or eliminate these problems. This practice may be used by facility users, test personnel, facility operators, and independent process validators to determine the suitability of a specific environment within a facility and of the testing process as a whole. Electrical measurements are addressed in other standards, such as Guide F980. Additional information on conducting irradiations can be found in Practices E798 and F1190. This practice also may be of use to test sponsors (organizations that establish test specifications or otherwise have a vested interest in the performance of electronics in neutron environments).

1.3 Methods for the evaluation and control of undesired contributions to damage are discussed in this practice. References to relevant ASTM standards and technical reports are provided. Processes and methods used to arrive at the appropriate test environments and specification levels for electronics systems are beyond the scope of this practice; however, the process for determining the 1-MeV equivalent displacement specifications from operational environment neutron spectra should employ the methods and parameters described herein. Some important considerations and recommendations are addressed in Appendix X1 (Nonmandatory information).

1.4 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.


electronics testing; neutron-induced damage; nuclear test reactors; test consistency ; 1 MeV-equivalence; ICS Number Code 19.080 (Electrical and electronic testing); 31.020 (Electronic components in general)

To find similar documents by ASTM Volume:

12.02 (Nuclear (II), Solar, and Geothermal Energy)

To find similar documents by classification:

19.080 (Electrical and electronic testing Including testing equipment Equipment for measuring electrical and magnetic quantities, see 17.220.20)

31.020 (Electronic components in general Magnetic components, see 29.100.10)

This document comes with our free Notification Service, good for the life of the document.

This document is available in either Paper or PDF format.

Document Number


Revision Level




Modification Type


Publication Date

July 15, 2013

Document Type


Page Count

13 pages

Committee Number