ASTM-E427 Standard Practice for Testing for Leaks Using the Halogen Leak Detector(Alkali-Ion Diode) (Withdrawn 2013)

ASTM-E427 - 1995 R06 EDITION - CANCELLED
Show Complete Document History

Document Center Inc. is an authorized dealer of ASTM standards.
The following bibliographic material is provided to assist you with your purchasing decision:

Standard Practice for Testing for Leaks Using the Halogen Leak Detector(Alkali-Ion Diode) (Withdrawn 2013)

Scope

1.1 This practice covers procedures for testing and locating the sources of gas leaking at the rate of 2.2 10 14 mol/s (5 1010 Std cm3/s). The test may be conducted on any device or component across which a pressure differential of halogen tracer gas may be created, and on which the effluent side of the area to be leak tested is accessible for probing with the halogen leak detector.

1.2 Five methods are described:

1.2.1 Method A - Direct probing with no significant halogen contamination in the atmosphere.

1.2.2 Method B - Direct probing with significant halogen contamination in the atmosphere.

1.2.3 Method C - Shroud test.

1.2.4 Method D - Air-curtain shroud test.

1.2.5 Method E Accumulation test.

1.3 The values stated in inch-pound units are to be regarded as the standard. The metric equivalents of inch-pound units may be approximate.

This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Significance and Use

Halogen leak testing can be used to indicate the presence, location and magnitude of leaks in a closed vessel. This test method is normally used for production examination. Its use with halogenated refrigerant gases has been declining because of concerns about the effect of these gases on the ozone layer.

Keywords

freon leak testing; halogen leak testing; heated anode halogen detection; leak testing; ICS Number Code 31.080.01 (Semi-conductor devices in general)

To find similar documents by ASTM Volume:

03.03 (Nondestructive Testing)

To find similar documents by classification:

31.080.01 (Semiconductor devices in general)

This document comes with our free Notification Service, good for the life of the document.

This document is available in either Paper or PDF format.

 

Customers who bought this document also bought:

ASTM-A276
Standard Specification for Stainless Steel Bars and Shapes

ASME-Y14.5M
Dimensioning and Tolerancing (Correctly Numbered ASME-Y14.5)

ASTM-B117
Standard Practice for Operating Salt Spray (Fog) Apparatus

Document Number

ASTM-E427-95(2006)

Revision Level

1995 R06 EDITION

Status

Cancelled

Modification Type

Withdrawn

Publication Date

Dec. 1, 2006

Document Type

Practice

Page Count

7 pages

Committee Number

E07.08