ASTM-E766 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

ASTM-E766 - 2014 R19 EDITION - CURRENT
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Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
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1.1 This practice is designed to calibrate the magnification of scanning electron microscopes (SEMs) using the National Institute of Standards and Technology (NIST) calibration specimen Standard Reference Material (SRM)484. Since the relationship between true magnification and magnification indicated on the SEM readout may be different at different magnifications, this practice must be applied to each magnification for which true magnification is desired.

1.2 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Keywords

Calibration-microscopes; Scanning electron microscope (SEM); scanning electron microscopes (SEM's), practice,; Electron microscopy; Scanning electron microscope (SEM); calibrating the magnification of scanning electron microscopes (SEM's),; practice; ICS Number Code 37.020 (Optical equipment)

To find similar documents by ASTM Volume:

03.01 (Metals -- Mechanical Testing; Elevated and Low-Temperature Tests; Metallography)

To find similar documents by classification:

37.020 (Optical equipment Including microscopes, telescopes, binoculars, optical materials, optical components and optical systems Ophthalmic equipment, see 11.040.70 Optical measuring instruments, see 17.180.30 Photographic equipment lenses, see 37.040.10)

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Document Number

ASTM-E766-14(2019)

Revision Level

2014 R19 EDITION

Status

Current

Modification Type

Revision

Publication Date

Nov. 19, 2019

Document Type

Practice

Page Count

6 pages

Committee Number

E04.11