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ASTM-E986
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Complete Document History
Standard Practice for Scanning Electron Microscope Beam Size Characterization
How to Order
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Complete Current Edition:
2004 R17 EDITION - REAPPROVED IN 2017 - June 15, 2017
Obsolete Revision Information:
2004 R10 EDITION - REAPPROVED IN 2010 - May 1, 2010
2004 EDITION - SCANNING ELECTRON MICROSCOPE B - July 1, 2004
1997 EDITION - SCANNING ELECTRON MICROSCOPE P - Oct. 10, 1997
1992 EDITION - SCANNING ELECTRON MICROSCOPE P - July 15, 1992
1986 EDITION - SCANNING ELECTRON MICROSCOPE P - Feb. 28, 1986