ASTM-F1153 › Complete Document History
Standard Test Method for Characterization of Metal-Oxide-Silicon (MOS) Structures by Capacitance-Voltage Measurements (Withdrawn 2003)


Obsolete Revision Information:
   1992 R02 EDITION - REAPPROVED IN 2002 - Dec. 1, 2002
   1992 R97 EDITION - REAPPROVED IN 1997 - May 15, 1992
   1992 EDITION - CHARACTERIZATION OF METAL-OXID - May 15, 1992
   1988 EDITION - CHARACTERIZATION OF METAL-OXID - May 27, 1988