ASTM-F1996 Standard Test Method for Silver Migration for Membrane Switch Circuitry (Withdrawn 2023)

ASTM-F1996 - 2014 EDITION - CANCELLED
Show Complete Document History

Document Center Inc. is an authorized dealer of ASTM standards.
The following bibliographic material is provided to assist you with your purchasing decision:

Standard Test Method for Silver Migration for Membrane Switch Circuitry (Withdrawn 2023)

Scope

1.1 This test method is used to determine the susceptibility of a membrane switch to the migration of the silver between circuit traces under dc voltage potential.

1.2 Silver migration will occur when special conditions of moisture and electrical energy are present.

Significance and Use

4.1 The effects of silver migration are short circuiting or reduction in insulation resistance. It is evidenced by staining or dicoloration between the cathode and anode conductive traces.

4.2 Accelerated testing may be accomplished by increasing the voltage over the specified voltages. (A typical starting point would be 5Vdc 50mA).

Keywords

membrane switch; silver dendrite; silver migration;

To find similar documents by ASTM Volume:

10.04 (Electronics; Declarable Substances in Materials; 3D Imaging Systems)

To find similar documents by classification:

77.120.99 (Other non-ferrous metals and their alloys)

This document comes with our free Notification Service, good for the life of the document.

This document is available in either Paper or PDF format.

Document Number

ASTM-F1996-14

Revision Level

2014 EDITION

Status

Cancelled

Modification Type

Withdrawn

Publication Date

Nov. 15, 2014

Document Type

Test Method

Page Count

3 pages

Committee Number

F01.18