ASTM-F26 › Standard Test Methods for Determining the Orientation of a Semiconductive Single Crystal (Withdrawn 2003)
Standard Test Methods for Determining the Orientation of a Semiconductive Single Crystal (Withdrawn 2003)
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Document Number
ASTM-F26-87a(1993)e1
Revision Level
1987A R93(E1) EDITION
Status
Superseded
Publication Date
May 1, 1993
Page Count
5 pages