ASTM-F744M Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric) (Withdrawn 2023)

ASTM-F744M - 2016 EDITION - CANCELLED
Show Complete Document History

Document Center Inc. is an authorized dealer of ASTM standards.
The following bibliographic material is provided to assist you with your purchasing decision:

Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric) (Withdrawn 2023)

Scope

1.1 This test method covers the measurement of the threshold level of radiation dose rate that causes upset in digital integrated circuits only under static operating conditions. The radiation source is either a flash X-ray machine (FXR) or an electron linear accelerator (LINAC).

1.2 The precision of the measurement depends on the homogeneity of the radiation field and on the precision of the radiation dosimetry and the recording instrumentation.

1.3 The test may be destructive either for further tests or for purposes other than this test if the integrated circuit being tested absorbs a total radiation dose exceeding some predetermined level. Because this level depends both on the kind of integrated circuit and on the application, a specific value must be agreed upon by the parties to the test (6.8).

1.4 Setup, calibration, and test circuit evaluation procedures are included in this test method.

1.5 Procedures for lot qualification and sampling are not included in this test method.

1.6 Because of the variability of the response of different device types, the initial dose rate and device upset conditions for any specific test is not given in this test method but must be agreed upon by the parties to the test.

1.7 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.8 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Significance and Use

5.1 Digital integrated circuits are specified to operate with their inputs and outputs in either a logical 1 or a logical 0 state. The occurrence of signals having voltage levels not meeting the specifications of either of these levels (an upset condition) may cause the generation and propagation of erroneous data in a digital system.

5.2 Knowledge of the radiation dose rate that causes upset in digital integrated circuits is essential for the design, production, and maintenance of electronic systems that are required to operate in the presence of pulsed radiation environments.

Keywords

DIC; digital integrated circuits; dose rate; ionizing radiation; radiation dose rate; threshold for upset; upset ;

To find similar documents by ASTM Volume:

10.04 (Electronics; Declarable Substances in Materials; 3D Imaging Systems)

To find similar documents by classification:

31.200 (Integrated circuits. Microelectronics Including electronic chips, logical and analogue microstructures Microprocessors, see 35.160)

This document comes with our free Notification Service, good for the life of the document.

This document is available in either Paper or PDF format.

 

Customers who bought this document also bought:

ISO/IEC-27001
Information security, cybersecurity and privacy protection - Information security management systems - Requirements

ISO/IEC-27002
Information security, cybersecurity and privacy protection - Information security controls

ISO-16750-2
Road vehicles - Environmental conditions and testing for electrical and electronic equipment - Part 2: Electrical loads

Document Number

ASTM-F744M-16

Revision Level

2016 EDITION

Status

Cancelled

Modification Type

Withdrawn

Publication Date

May 15, 2016

Document Type

Test Method

Page Count

7 pages

Committee Number

F01.11