ASTM-F867M Guide for Ionizing Radiation Effects (Total Dose) Testing of Semiconductor Devices [Metric] (Withdrawn 1998)

ASTM-F867M - 1994A EDITION - SUPERSEDED -- See the following: ASTM-F1893
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Guide for Ionizing Radiation Effects (Total Dose) Testing of Semiconductor Devices [Metric] (Withdrawn 1998)

Keywords

ICS Number Code 17.240 (Radiation measurements); 31.080.01 (Semi-conductor devices in general)

To find similar documents by ASTM Volume:

10.04 (Electronics; Declarable Substances in Materials; 3D Imaging Systems)

To find similar documents by classification:

17.240 (Radiation measurements Including dosimetry Radiation protection, see 13.280)

31.080.01 (Semiconductor devices in general)

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Document Number

ASTM-F867M-94A

Revision Level

1994A EDITION

Status

Superseded

Modification Type

Replaced

Publication Date

Dec. 15, 1994

Document Type

Guide

Page Count

7 pages