BS-9620 › Specification for quartz crystal oscillators of assessed quality: generic data and methods of test

BS-9620 - AMD 4613 - SUPERSEDED
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Specification for quartz crystal oscillators of assessed quality: generic data and methods of test

Keywords

Voltage measurement;Layout;Circuits;Frequency measurement;Impedance measurement;Piezoelectric devices;Signal distortion;Attenuation;Sampling methods;Technical documents;Stability;Qualification approval;Harmonics;Inspection;Electrical testing;High-voltage tests;Test equipment;Electrical wave measurement;Ratings;Frequency modulation;Oscillators;Approval testing;Electrical measurement;Pulse modulation;Radiofrequencies;Detail specification;Dielectric devices;Resistance measurement;Performance testing;Environmental testing;Phase (electric);Electrical insulation;Frequencies;Electric distortion;Definitions;Specification (approval);Mechanical testing;Endurance testing;Electronic equipment and components;Quality assurance systems;Testing conditions;Crystal resonators;Amplitude modulation;Power measurement (electric);Logic circuits;Marking;Assessed quality;Time

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31.140 (Piezoelectric devices)

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Document Number

BS-9620

Revision Level

AMD 4613

Status

Superseded

Publication Date

Aug. 1, 1985

Committee Number

W/-