BS-EN-15991 › Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)
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Ceramics, Raw materials, Refractory materials, Silicon inorganic compounds, Carbides, Particulate materials, Chemical analysis and testing, Determination of content, Impurities, Trace element analysis, Emission spectrophotometry, Vaporization
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BS EN 15991:2015
Nov. 30, 2015
BS EN 15991:2011