BS-EN-15991 Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)

BS-EN-15991 - 2015 EDITION - CURRENT
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Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)

Keywords

Ceramics, Raw materials, Refractory materials, Silicon inorganic compounds, Carbides, Particulate materials, Chemical analysis and testing, Determination of content, Impurities, Trace element analysis, Emission spectrophotometry, Vaporization

To find similar documents by classification:

81.060.10 (Raw materials)

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Price:

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Document Number

BS EN 15991:2015

Revision Level

2015 EDITION

Status

Current

Publication Date

Nov. 30, 2015

Replaces

BS EN 15991:2011

Page Count

30

ISBN

9780580831409

International Equivalent

EN 15991:2015

Committee Number

RPI/1