BS-EN-15991 › Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)
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Ceramics,Carbides,Determination of content,Vaporization,Trace element analysis,Chemical analysis and testing,Silicon inorganic compounds,Particulate materials,Raw materials,Refractory materials,Impurities,Emission spectrophotometry
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BS EN 15991:2015
Nov. 30, 2015
BS EN 15991:2011