BS-EN-15991 › Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)
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Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)
Keywords
Ceramics;Carbides;Determination of content;Vaporization;Trace element analysis;Chemical analysis and testing;Silicon inorganic compounds;Particulate materials;Raw materials;Refractory materials;Impurities;Emission spectrophotometry
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Document Number
BS EN 15991:2015
Revision Level
2015 EDITION
Status
Current
Publication Date
Nov. 30, 2015
Replaces
BS EN 15991:2011
Page Count
30
ISBN
9780580831409
International Equivalent
EN 15991:2015
Committee Number
RPI/1